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Probe Cards
AMD HIGH PIN COUNT PROBING CHALLENGES ON LEADING EDGE GPU: TECHNOPROBE TPEG MEMS VS. COBRA
A NEW APPROACH TO LOW PIN COUNT PRODUCTS TEST FOUND VERTICAL PROBES FOR TO BE SUPERIOR TO CANTILEVER
GENERAL OVERVIEW ON PAD DAMAGE: PROBE KEY PARAMETERS AND OTHER CAUSES
CHALLENGES PROBING NEXT GENERATION FULL ARRAY PRODUCTS WITH 60 UM PITCH AND BELOW
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